发明名称 Method for manufacturing a semiconductor device and a semiconductor device manufactured thereby
摘要 A method for manufacturing a semiconductor device is provided, which is consisting of the steps of: forming a transistor on a surface region of a semiconductor substrate which is isolated by an insulating isolation region; forming an inter-layer insulation film provide with a hydrogen supplying path that reaches said isolation region on said semiconductor substrate on which said transistor is formed; and supplying hydrogen in said semiconductor substrate from said hydrogen supplying path through said isolation region by carrying out heat treatment. And also the semiconductor device is provided manufactured thereby.
申请公布号 US2005032320(A1) 申请公布日期 2005.02.10
申请号 US20040910992 申请日期 2004.08.04
申请人 YOKOYAMA TAKASHI 发明人 YOKOYAMA TAKASHI
分类号 H01L21/768;H01L21/30;H01L21/322;H01L21/336;H01L21/8234;H01L23/522;H01L29/78;H01L29/786;(IPC1-7):H01L21/823 主分类号 H01L21/768
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