发明名称 |
Method for manufacturing a semiconductor device and a semiconductor device manufactured thereby |
摘要 |
A method for manufacturing a semiconductor device is provided, which is consisting of the steps of: forming a transistor on a surface region of a semiconductor substrate which is isolated by an insulating isolation region; forming an inter-layer insulation film provide with a hydrogen supplying path that reaches said isolation region on said semiconductor substrate on which said transistor is formed; and supplying hydrogen in said semiconductor substrate from said hydrogen supplying path through said isolation region by carrying out heat treatment. And also the semiconductor device is provided manufactured thereby.
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申请公布号 |
US2005032320(A1) |
申请公布日期 |
2005.02.10 |
申请号 |
US20040910992 |
申请日期 |
2004.08.04 |
申请人 |
YOKOYAMA TAKASHI |
发明人 |
YOKOYAMA TAKASHI |
分类号 |
H01L21/768;H01L21/30;H01L21/322;H01L21/336;H01L21/8234;H01L23/522;H01L29/78;H01L29/786;(IPC1-7):H01L21/823 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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