发明名称 |
SILICON EPITAXIAL WAFER AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a silicon epitaxial wafer which can prevent the generation of an observable haze phenomenon using a light condensing lamp in a dark room and have the main surface of a face direction of about [110], and a method for manufacturing the wafer. SOLUTION: A silicon epitaxial layer having a haze level of 0.18 ppm or less is formed by vapor phase growth on the main surface of a silicon single crystalline substrate having an off-angle inclined by an angle not smaller than 0.5°and not larger than 3°in a <100> axial direction nearest from a ä110} face. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005039111(A) |
申请公布日期 |
2005.02.10 |
申请号 |
JP20030275967 |
申请日期 |
2003.07.17 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
NAKASUGI SUNAO |
分类号 |
C23C16/24;H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
C23C16/24 |
代理机构 |
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地址 |
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