发明名称 ANALOG/DIGITAL CONVERSION CIRCUIT AND ITS TESTING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an analog/digital conversion circuit capable of performing high-speed AD conversion even while suppressing an interference of the potential of an analog input that is inputted immediately before. SOLUTION: This analog/digital conversion circuit is provided with a comparator (1) for comparing reference potential with an analog input, a first switch (SW4) for transmitting the analog input to a comparison input line (8) of the comparator (1), a second switch (SW5) for transmitting initialization potential (Vss) to the comparison input line (8) of the comparator (1), and an input control circuit (5) for turning on the second switch (SW5) to initialize the potential of the comparison input line (8) of the comparator (1) into the initialization potential (Vss) during an AD conversion period and the non-operating period of the comparator (1). COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005033483(A) 申请公布日期 2005.02.03
申请号 JP20030195975 申请日期 2003.07.11
申请人 TOSHIBA LSI SYSTEM SUPPORT KK;TOSHIBA CORP 发明人 FUJITA MASAHARU
分类号 H03M1/38;H03M1/10;(IPC1-7):H03M1/38 主分类号 H03M1/38
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