发明名称 Product defect analysis and resolution system
摘要 A defect analysis and resolution (DAR) system analyzes product performance data stored by a firm. The DAR system may store data representing product performance as a plurality of data objects, each object having fields representing various product performance parameters. The system also may store a database representing expected product performance data across the same parameters. If the system monitors a statistically significant deviation between actual performance data and expected performance data, it may trigger a defect analysis process. The defect analysis process may exchange product performance data with systems of possibly other market participants involving the same product. An analysis may be performed on a larger set of data to determine likely causes of product defects and possible resolution. Resolution solutions may be stored in a database for further consideration by members of the firm.
申请公布号 US2005027487(A1) 申请公布日期 2005.02.03
申请号 US20040847324 申请日期 2004.05.18
申请人 IYER SUPRIYA 发明人 IYER SUPRIYA
分类号 G06Q30/00;(IPC1-7):G06F11/30 主分类号 G06Q30/00
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