发明名称 Electroless plating method, electroless plating device, and production method and production device of semiconductor device
摘要 The invention is purposed to reduce the amount of the electroless plating solution used for plating, to facilitate compositional control of the plating solution, and to prevent degradation of quality of the plating film (deposit) by oxygen dissolved in the plating solution. An electroless plating method in which a previously prepared electroless plating solution is exposed to a depressurized atmosphere to decrease the gas components existing in the solution, and while maintaining the plating solution in the form of a continuous thin layer, the surface to be plated of the substrate on which to form an electroless plating film is brought into contact with said layer of the plating solution and maintained in this state for a required period of time to perform electroless plating. An electroless plating device, and a production method and a production device of semiconductor devices are also disclosed.
申请公布号 US2005022745(A1) 申请公布日期 2005.02.03
申请号 US20040898201 申请日期 2004.07.26
申请人 HITACHI, LTD. 发明人 NAKANO HIROSHI;ITABASHI TAKEYUKI;AKAHOSHI HARUO
分类号 C23C18/16;B05D1/18;H01L21/288;H01L21/3205;H01L21/768;H01L23/52;H01L23/532;(IPC1-7):B05D1/18 主分类号 C23C18/16
代理机构 代理人
主权项
地址