发明名称 Electron beam apparatus with specimen holder
摘要 <p>Electron beam equipment like a transmission electron microscope has an identification unit (IDU) and a preparation holder (PH) (6) with a retaining element (18) for holding a preparation. It also has a reader unit (19) for non-contact read-out of the IDU, a goniometer (24), into which the PH is inserted, and a device (26) for controlling the goniometer's movement modes.</p>
申请公布号 EP1503398(A2) 申请公布日期 2005.02.02
申请号 EP20040017632 申请日期 2004.07.26
申请人 CARL ZEISS NTS GMBH 发明人 HILLER, STEPHAN;NIEBEL, HARALD;KOENIG, RICHARD
分类号 H01J37/20;H01J37/26;(IPC1-7):H01J37/20 主分类号 H01J37/20
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