发明名称 |
Electron beam apparatus with specimen holder |
摘要 |
<p>Electron beam equipment like a transmission electron microscope has an identification unit (IDU) and a preparation holder (PH) (6) with a retaining element (18) for holding a preparation. It also has a reader unit (19) for non-contact read-out of the IDU, a goniometer (24), into which the PH is inserted, and a device (26) for controlling the goniometer's movement modes.</p> |
申请公布号 |
EP1503398(A2) |
申请公布日期 |
2005.02.02 |
申请号 |
EP20040017632 |
申请日期 |
2004.07.26 |
申请人 |
CARL ZEISS NTS GMBH |
发明人 |
HILLER, STEPHAN;NIEBEL, HARALD;KOENIG, RICHARD |
分类号 |
H01J37/20;H01J37/26;(IPC1-7):H01J37/20 |
主分类号 |
H01J37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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