发明名称 Polishing pad for semiconductor wafer and polishing process using thereof
摘要 An object of the present invention is to provide a polishing pad for a semiconductor wafer which can perform a stable polishing while preventing a polishing layer from floating up from a supporting layer and a surface of a polishing pad from bending during polishing using a polishing pad having a multi-layered structure of a polishing layer and a supporting layer, and a polishing process using thereof. The polishing pad of the present invention is characterized in that it is comprising a supporting layer which is a non-porous elastic body and a polishing layer which is laminated on one surface of the supporting layer, and a polishing process using thereof. Shore D hardness of the polishing layer is preferably 35 or more, and hardness of the supporting layer is preferably lower than that of the polishing layer.
申请公布号 US6848974(B2) 申请公布日期 2005.02.01
申请号 US20020252696 申请日期 2002.09.24
申请人 JSR CORPORATION 发明人 HASEGAWA KOU;HOSAKA YUKIO
分类号 B24B37/00;B24B37/04;B24B37/20;B24B37/22;B24B37/24;B24D13/12;B24D13/14;H01L21/304;H01L21/306;(IPC1-7):B24B1/00 主分类号 B24B37/00
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