发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING IMPROVED OPERATION STABILITY AND RELIABILITY
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to improve stability and reliability of operation by forming a stable metal contact irrespective of increase of topology of the device. CONSTITUTION: A first interlayer dielectric covering a bit line and a storage node contact plug penetrating the interlayer dielectric are formed on a substrate. A capacitor oxide layer is formed on the first interlayer dielectric. A capacitor hole exposing the storage node contact plug and a metal contact hole exposing the bit line are formed by etching the capacitor oxide layer using a mask. A storage node and a metal contact plug are formed by depositing a barrier metal and tungsten(41) on an overall structure. The surface is planarized until the tungsten mask is exposed. An oxide layer(42) and a cell open mask are formed on the overall structure.
申请公布号 KR20050011941(A) 申请公布日期 2005.01.31
申请号 KR20030051017 申请日期 2003.07.24
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, KEUN TAE
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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