发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING IMPROVED OPERATION STABILITY AND RELIABILITY |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to improve stability and reliability of operation by forming a stable metal contact irrespective of increase of topology of the device. CONSTITUTION: A first interlayer dielectric covering a bit line and a storage node contact plug penetrating the interlayer dielectric are formed on a substrate. A capacitor oxide layer is formed on the first interlayer dielectric. A capacitor hole exposing the storage node contact plug and a metal contact hole exposing the bit line are formed by etching the capacitor oxide layer using a mask. A storage node and a metal contact plug are formed by depositing a barrier metal and tungsten(41) on an overall structure. The surface is planarized until the tungsten mask is exposed. An oxide layer(42) and a cell open mask are formed on the overall structure.
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申请公布号 |
KR20050011941(A) |
申请公布日期 |
2005.01.31 |
申请号 |
KR20030051017 |
申请日期 |
2003.07.24 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
KIM, KEUN TAE |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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