发明名称 Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system
摘要 A lithographic projection apparatus includes a support configured to support a patterning device, the patterning device configure to pattern the projection beam according to a desired patter. The apparatus has a substrate table configure to hold a substrate, a projection system configured to project the patterned beam onto a target portion of the substrate. The apparatus also has a purge gas supply system configured to provide a purge gas near a surface of a component of the lithographic projection apparatus. The purge gas supply system includes a purge gas mixture generator configured to generate a purge gas mixture which includes at least one purging gas and a moisture. The purge gas mixture generator has a moisturizer configured to add the moisture to the purge gas and a purge gas mixture outlet connected to the purge gas mixture generator configured to supply the purge gas mixture near the surface.
申请公布号 US2005017198(A1) 申请公布日期 2005.01.27
申请号 US20030623180 申请日期 2003.07.21
申请人 ASML NETHERLANDS B.V.;AERONEX, INC. 发明人 VAN DER NET ANTONIUS JOHANNES;SPIEGELMAN JEFFREY J.;VAN BRAGT JOHANNUS JOSEPHUS
分类号 G02B27/00;G03F7/20;(IPC1-7):G21G5/00 主分类号 G02B27/00
代理机构 代理人
主权项
地址