| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a testing device for changing a hardware logic of a gate array held by a test module corresponding to the properties of a device under test (DUT), and performing a proper test to the DUT. <P>SOLUTION: This testing device for testing a device to be tested is equipped with a test module for supplying test data to a device under test, a test program storage part for storing a plurality of test programs for realizing respectively a plurality of test sequences, and a control device for controlling operation by the test module by performing the test program. The test module has a register for holding a register value supplied from the control device by performing the test program by the control device, and the gate array for changing the hardware logic by the register value held by the register, and supplying the test data corresponding to the test sequence realized by the test program to the device under test. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
