发明名称 |
Semiconductor device and method of fabricating same |
摘要 |
A semiconductor device having CMOS circuits formed on a glass substrate. The CMOS circuits are composed of TFTs. Lightly doped regions are formed only in the N-channel TFTs. When P-channel TFTs are formed, the conductivity type of the lightly doped regions is converted by a boron ion implant. Each CMOS circuit consists of an N-channel TFT having the lightly doped regions and a P-channel TFT having no lightly doped regions.
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申请公布号 |
US2005017241(A1) |
申请公布日期 |
2005.01.27 |
申请号 |
US20040918551 |
申请日期 |
2004.08.16 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPAN CORPORATION |
发明人 |
ZHANG HONGYONG |
分类号 |
H01L29/786;H01L21/336;H01L21/77;H01L21/84;H01L27/12;(IPC1-7):H01L29/04;H01L27/01 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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