发明名称 Semiconductor device and method of fabricating same
摘要 A semiconductor device having CMOS circuits formed on a glass substrate. The CMOS circuits are composed of TFTs. Lightly doped regions are formed only in the N-channel TFTs. When P-channel TFTs are formed, the conductivity type of the lightly doped regions is converted by a boron ion implant. Each CMOS circuit consists of an N-channel TFT having the lightly doped regions and a P-channel TFT having no lightly doped regions.
申请公布号 US2005017241(A1) 申请公布日期 2005.01.27
申请号 US20040918551 申请日期 2004.08.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPAN CORPORATION 发明人 ZHANG HONGYONG
分类号 H01L29/786;H01L21/336;H01L21/77;H01L21/84;H01L27/12;(IPC1-7):H01L29/04;H01L27/01 主分类号 H01L29/786
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