发明名称 In-process tape bur monitoring
摘要 The protective tape applied to the front surface of a semiconductor wafer to protect the wafer during backgrinding must be trimmed so that excess tape, known as tape bur, does not extend beyond the perimeter of the wafer. Tape bur may interfere with backgrinding by causing improper grinding, which may lead to wafer breakage. The tape cutter that trims the protective tape to eliminate tape bur is provided with a sensor which detects whether tape bur has been trimmed from the wafer. If tape bur has not been removed from the wafer, corrective action is taken to prevent the wafer from being backgrinded.
申请公布号 US6845695(B2) 申请公布日期 2005.01.25
申请号 US20030446705 申请日期 2003.05.29
申请人 MICRON TECHNOLOGY, INC. 发明人 PENG NEO CHEE
分类号 H01L21/00;H01L21/301;(IPC1-7):B26D5/00;B26D7/06 主分类号 H01L21/00
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