发明名称 |
Integrated circuit memory device, has column select IO blocks and N-type sense amplifier blocks arranged in zig-zag layout pattern that spans two rows of zeroth sense amplifier region |
摘要 |
<p>The device has two memory blocks electrically coupled by respective pairs of bit lines. Column select IO blocks (150) and N-type sense amplifier blocks (140) are arranged in a zig-zag layout pattern that spans two rows of a zeroth sense amplifier region. The zig-zag layout sequence of sense amplifier blocks is interleaved with the zig-zag layout sequence of the column select IO blocks.</p> |
申请公布号 |
DE102004029846(A1) |
申请公布日期 |
2005.01.20 |
申请号 |
DE20041029846 |
申请日期 |
2004.06.16 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, HYUN-SEOK;KIM, KYUNG-HO;KIM, HYEUN-SU |
分类号 |
H01L21/8242;G11C7/06;G11C7/18;G11C11/401;G11C11/4091;G11C11/4097;H01L27/108;(IPC1-7):G11C11/409 |
主分类号 |
H01L21/8242 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|