发明名称 Integrated circuit memory device, has column select IO blocks and N-type sense amplifier blocks arranged in zig-zag layout pattern that spans two rows of zeroth sense amplifier region
摘要 <p>The device has two memory blocks electrically coupled by respective pairs of bit lines. Column select IO blocks (150) and N-type sense amplifier blocks (140) are arranged in a zig-zag layout pattern that spans two rows of a zeroth sense amplifier region. The zig-zag layout sequence of sense amplifier blocks is interleaved with the zig-zag layout sequence of the column select IO blocks.</p>
申请公布号 DE102004029846(A1) 申请公布日期 2005.01.20
申请号 DE20041029846 申请日期 2004.06.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, HYUN-SEOK;KIM, KYUNG-HO;KIM, HYEUN-SU
分类号 H01L21/8242;G11C7/06;G11C7/18;G11C11/401;G11C11/4091;G11C11/4097;H01L27/108;(IPC1-7):G11C11/409 主分类号 H01L21/8242
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