| 摘要 |
PROBLEM TO BE SOLVED: To structure a probe card used for the conduction test of electronic circuits so that it can mount more electric components. SOLUTION: The probe card is characterised in that at least one mounting board is arranged on a card board with a plurality of probes arranged thereon and a plurality of electric components are disposed on the mounting board in the form of a plurality of layers laminated in the vertical direction to the mounting board. COPYRIGHT: (C)2005,JPO&NCIPI
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