发明名称 Semiconductor memory device including a delaying circuit capable of generating a delayed signal with a substantially constant delay time
摘要 A semiconductor memory device with a bit line sense enable signal generating circuit is disclosed. The semiconductor memory device includes a word line selection signal generating circuit for generating a word line selection signal for selecting a word line; a delay circuit for generating a delayed signal by delaying a signal to the same extent of time period which is needed for the word line selection signal generating circuit to generate the word line selection signal; and a Schmitt trigger for generating a word line enable detecting signal by receiving an output signal from the delay circuit and that is connected to a power supply voltage which has the same voltage level as the voltage level used to enable the word line. The bit line sense enable signal generating circuit in the present invention occupies a relatively smaller layout area than that of conventional semiconductor memory devices. Furthermore, the generating circuit generates a bit line sense enable signal with constant delay time that is immune from process changes, voltage fluctuations, and temperature fluctuations.
申请公布号 US6845049(B2) 申请公布日期 2005.01.18
申请号 US20020313817 申请日期 2002.12.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM KYU-NAM;YOO JEI-HWAN;KANG YOUNG-GU;LEE JONG-WON;SHIM JAE-YOON
分类号 G11C11/409;G11C7/04;G11C7/06;G11C7/08;G11C7/22;G11C8/08;(IPC1-7):G11C7/00 主分类号 G11C11/409
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