发明名称 METHOD FOR FABRICATING GATE STRUCTURE OF FET WITH METAL-CONTAINING GATE ELECTRODE TO ETCH METALS OR METAL-CONTAINING COMPOUNDS
摘要 PURPOSE: A method for fabricating a gate structure of a FET(field effect transistor) with a metal-containing gate electrode is provided to etch metals or metal-containing compounds by using plasma including bromine-containing gas. CONSTITUTION: A substrate is prepared which has a metal-containing gate electrode layer formed on a gate dielectric layer. A patterned mask is formed on the metal-containing gate electrode layer, defining the position and topographic dimensions of the gate structure. The metal-containing gate electrode layer is etched by using plasma including bromine-containing gas. The gate dielectric layer is etched(110).
申请公布号 KR20050007143(A) 申请公布日期 2005.01.17
申请号 KR20040052563 申请日期 2004.07.07
申请人 APPLIED MATERIALS INC. 发明人 CHOI, JIN HAN;LEE, KYEONG TAE;DESHMUKH, SHASHANK;YI, SANG
分类号 H01L21/336;H01L21/28;H01L21/3213;H01L21/8238;H01L29/78 主分类号 H01L21/336
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