发明名称 |
METHOD FOR FABRICATING GATE STRUCTURE OF FET WITH METAL-CONTAINING GATE ELECTRODE TO ETCH METALS OR METAL-CONTAINING COMPOUNDS |
摘要 |
PURPOSE: A method for fabricating a gate structure of a FET(field effect transistor) with a metal-containing gate electrode is provided to etch metals or metal-containing compounds by using plasma including bromine-containing gas. CONSTITUTION: A substrate is prepared which has a metal-containing gate electrode layer formed on a gate dielectric layer. A patterned mask is formed on the metal-containing gate electrode layer, defining the position and topographic dimensions of the gate structure. The metal-containing gate electrode layer is etched by using plasma including bromine-containing gas. The gate dielectric layer is etched(110). |
申请公布号 |
KR20050007143(A) |
申请公布日期 |
2005.01.17 |
申请号 |
KR20040052563 |
申请日期 |
2004.07.07 |
申请人 |
APPLIED MATERIALS INC. |
发明人 |
CHOI, JIN HAN;LEE, KYEONG TAE;DESHMUKH, SHASHANK;YI, SANG |
分类号 |
H01L21/336;H01L21/28;H01L21/3213;H01L21/8238;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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