发明名称 APPARATUS AND METHOD FOR MEASURING RELATIVE INDEX DIFFERENCE IN OPTICAL WAVEGUIDE STRUCTURE, AND PROGRAM FOR CALCULATING RELATIVE INDEX DIFFERENCE IN OPTICAL WAVEGUIDE STRUCTURE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus for measuring the relative index difference between materials of the core section and the clad section in an optical waveguide structure after producng the optical waveguide structure. SOLUTION: The apparatus for measuring the relative index difference in the optical waveguide structure contains: a single wavelength light source which emits light at a single wavelength entering the optical waveguide structure having the core section and the clad section; an imaging means to image the light exiting from the optical waveguide structure; a photographing means to photograph the image produced by the imaging means and to acquire the two-dimensional distribution of the energy density in the image; and a calculating means to calculate the relative index difference between the materials of the core section and the clad section in the optical waveguide structure based on the width of the core section in the optical waveguide structure obtained from the primary differential of the energy density in the image converted into logarithm along a specified direction and based on the gradient in a straight line part of the primary differential. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005010648(A) 申请公布日期 2005.01.13
申请号 JP20030176936 申请日期 2003.06.20
申请人 NIPPON HOSO KYOKAI 发明人 SASAKI KENTARO;KAWAMURA KIICHI
分类号 G01N21/41;G01M11/02;G02B6/12;(IPC1-7):G02B6/12 主分类号 G01N21/41
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