发明名称 |
CHARACTERISTIC MEASURING DEVICE FOR ELECTRONIC PART, AND METHOD FOR OPERATING THE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a characteristic measuring device which easily and surely performs characteristic measurement of an electronic part, and also to provide a method for operating the device. SOLUTION: The device for measuring characteristics of a quartz oscillator comprises: a vertically moving rising and falling stage M; a mount board 2 fixed to the stage M; a fixed stage F provided opposite to the rising and falling stage; a contact board 3 fixed to the fixed stage; a strut B capable of fixing the fixed stage and vertically moving the rising and falling stage; a drive part M1 mounted on the rising and falling stage M; and a drive control device S for giving a drive control signal to the drive part M1. A positioning stud longer than a pin terminal is formed on the contact board. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005009900(A) |
申请公布日期 |
2005.01.13 |
申请号 |
JP20030171461 |
申请日期 |
2003.06.17 |
申请人 |
DAISHINKU CORP |
发明人 |
MATSUMOTO TOSHIYA;NISHIYAMA MASAMICHI |
分类号 |
G01R29/22;H01R13/24;(IPC1-7):G01R29/22 |
主分类号 |
G01R29/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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