| 发明名称 |
Probe for electrical measurements, particularly eddy current inspections |
| 摘要 |
Probe (1) comprises electrical components (4,7) arranged on a flexible substrate (16) to be applied on a testing body (10). The probe with the substrate is able to fit different curved radii of the testing body. The probe has a rear filling (22) which partially covers the electrical components. |
| 申请公布号 |
EP1496355(A1) |
申请公布日期 |
2005.01.12 |
| 申请号 |
EP20030015494 |
申请日期 |
2003.07.09 |
| 申请人 |
SIEMENS AKTIENGESELLSCHAFT |
发明人 |
BAER, LUDWIG;HEINRICH, WERNER, DR. |
| 分类号 |
G01N27/90 |
主分类号 |
G01N27/90 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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