发明名称 Vertical NROM having a storage density of 1 bit per 1F2
摘要 Structures and methods for vertical memory cell. The vertical memory cell includes a vertical metal oxide semiconductor field effect transistor (MOSFET) extending outwardly from a substrate. The MOSFET has a first source/drain region, a second source/drain region, a channel region between the first and the second source/drain regions, and a gate separated from the channel region by a gate insulator. A first transmission line is coupled to the first source/drain region. A second transmission line is coupled to the second source/drain region. The MOSFET is adapted to be programmed to have a charge trapped in at least one of a first storage region and a second storage region in the gate insulator and operated with either the first source/drain region or the second source/drain region serving as the source region.
申请公布号 US6842370(B2) 申请公布日期 2005.01.11
申请号 US20040838276 申请日期 2004.05.04
申请人 MICRON TECHNOLOGY, INC. 发明人 FORBES LEONARD
分类号 G11C16/02;G11C16/04;H01L21/28;H01L21/336;H01L21/338;H01L21/8238;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/105;H01L27/108;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C11/34 主分类号 G11C16/02
代理机构 代理人
主权项
地址