发明名称 |
Method of electrically testing semiconductor devices |
摘要 |
A method of electrically testing a semiconductor device preferably includes connecting a common input/output signal channel (line) of a socket board to two or more data pins of the semiconductor device. Signals output from the semiconductor device may be sequentially read via the short-circuited input/output signal lines of the socket board by carrying out a byte operation function. The throughput of a semiconductor test system can thereby be increased by increasing the number of devices that can be tested in parallel.
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申请公布号 |
US6842031(B2) |
申请公布日期 |
2005.01.11 |
申请号 |
US20030361156 |
申请日期 |
2003.02.07 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KOH GIL-YOUNG;BANG JEONG-HO;TCHO JONG-BOK |
分类号 |
G01R31/28;G01R31/319;G11C11/401;G11C29/56;(IPC1-7):G01R31/00 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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