发明名称 Electron microscope
摘要 An electron microscope which permits an operator to perform astigmatic correction and beam alignment. A field of view capable of clearly displaying astigmatism or beam misalignment in terms of a Ronchigram is placed on the optical axis. Then, the operator selects a Ronchigram display mode. A first or second TV camera such as a CCD camera is selected and placed on the optical axis while maintaining the electron optics in the STEM imaging mode. Under this condition, a Ronchigram signal is obtained from the TV camera and supplied to a computer via a TV power supply and an interface. As a result, a Ronchigram of appropriate size and brightness is displayed in an image display region on a display device. The operator corrects astigmatism or adjusts the alignment while observing the Ronchigram.
申请公布号 US6841775(B2) 申请公布日期 2005.01.11
申请号 US20030437265 申请日期 2003.05.13
申请人 JEOL LTD. 发明人 KONDO YUKIHITO;MATSUSHITA MITSUHIDE;OHSAKI MITSUAKI
分类号 H01J37/28;G01Q30/02;G01Q30/04;G21K7/00;H01J37/22;H01J37/244;H01J37/26;(IPC1-7):H01J37/26 主分类号 H01J37/28
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