发明名称 |
METHOD OF FORMING ISOLATION LAYER TO MINIMIZE MOAT USING LINER NITRIDE LAYER |
摘要 |
PURPOSE: A method for forming an isolation layer using a liner nitride layer is provided to minimize moat by restraining the side-etching of the liner nitride layer. CONSTITUTION: A trench is formed in a substrate by using a pad nitride layer(23b) as a mask. A liner nitride layer(26) is formed on the trench. An isolation layer(28a) is formed by filling an insulating layer in the trench and planarizing to expose the pad nitride layer. The pad nitride layer and the liner nitride layer are partially removed by first etching. The isolation layer is partially removed so as to cover the side of the liner nitride layer. The surface of the substrate is exposed by second etching of the pad nitride layer.
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申请公布号 |
KR20050003046(A) |
申请公布日期 |
2005.01.10 |
申请号 |
KR20030043173 |
申请日期 |
2003.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JEON, SEUNG JOON |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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