发明名称 |
METHOD FOR FORMING METALLIC LAYER USING SELECTIVELY RESIST FLOW OPERATION SELECTIVELY ACCORDING TO REGIONS WHERE THE METALLIC LAYER IS FORMED |
摘要 |
PURPOSE: A method for forming a metallic layer is provided to selectively adopt a resist flow operation according to regions where the metallic layer is formed. CONSTITUTION: An oxide layer for trench(500) is formed on a substrate(400). A first photoresist pattern is formed on the oxide layer. A second photoresist pattern(221P) is formed using a resist flow operation on the first photoresist pattern. A first trench is formed by etching the oxide layer for trench using the second photoresist pattern as a mask. A third photoresist pattern is formed by removing the second photoresist pattern and using a metallic interconnection mask for metallic interconnection region/peripheral circuit. A second trench is formed by etching the oxide layer for trench using the third photoresist pattern as a mask. Metallic interconnections are formed by removing the third photoresist pattern and filling the first and second trenches with a conductive material.
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申请公布号 |
KR20050002311(A) |
申请公布日期 |
2005.01.07 |
申请号 |
KR20030043682 |
申请日期 |
2003.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
EOM, JAE DOO;KIM, JONG HOON |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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