发明名称 Treatment of silicon based semiconductors using a halogen solution to form a layer of silicon oxide to produce defect free surfaces in integrated circuits
摘要 <p>Treatment of a silicon based semiconductor material by a humid route comprises the formation of a layer of silicon oxide by putting the silicon surface in contact with a halogen solution, in an appropriate solvent. An independent claim is also included for an integrated circuit incorporating a layer of silicon oxide obtained.</p>
申请公布号 FR2857154(A1) 申请公布日期 2005.01.07
申请号 FR20030008055 申请日期 2003.07.02
申请人 STMICROELECTRONICS SA 发明人 CHEMLA MARIUS;PETITDIDIER SEBASTIEN;LEVY DIDIER;ROUELLE FRANCOIS
分类号 H01L21/306;H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/306
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