发明名称 SONOS MEMORY DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a SONOS memory device, in which retention property is maintained normally, and a memory node layer is maintained in amorphous state during a MOS process performed at elevated temperature, and to provide its manufacturing method. SOLUTION: The SONOS memory device has a semiconductor substrate, and a multifunctional device which is formed in the semiconductor substrate and has both of a switching function and a data storage function. The multifunctional device contains a first impurity area and a second impurity area which are separated centering at a channel, and a data storage type lamination which is formed on the semiconductor substrate between those areas, and is formed by laminating a tunneling oxide film, the memory node layer in which data are saved, a shielding film and an electrode layer successively. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005005715(A) 申请公布日期 2005.01.06
申请号 JP20040172645 申请日期 2004.06.10
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 JEON SANG-HUN;CHAE SOO-DOO;KIM JU-HYUNG;KIM CHUNG-WOO
分类号 H01L21/8247;H01L21/28;H01L27/115;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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