发明名称 Timing generator and semiconductor test apparatus
摘要 There is provided a timing generator capable of absorbing a delay time error of a variable delay circuit without increasing the number of bits of path data and suppressing deterioration of the timing accuracy from the designed value to the minimum. The timing generator is configured to include a selection unit 13 which assigns five-bit delay device candidates to a three-bit partial bit signal of all the bit signals constituting the path data outputted from a linearization memory 12 and selects three delay devices whose number is equal to the bit count of the partial bit signal.
申请公布号 US2005001648(A1) 申请公布日期 2005.01.06
申请号 US20040484980 申请日期 2004.08.26
申请人 YAMAMOTO KAZUHIRO 发明人 YAMAMOTO KAZUHIRO
分类号 G01R31/319;H03K5/00;H03K5/13;(IPC1-7):G01R31/34 主分类号 G01R31/319
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