| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an integrated circuit for a smart card having improved test performance and to provide a related method. <P>SOLUTION: According to the present invention, the integrated circuit for a smart card includes a transceiver which communicates with a host device and a joint test action group (JTAG) test controller for carrying out at least one test operation. Further, the integrated circuit can include a processor which allows the JTAG test controller to start the at least one test operation based on the reception of at least one test request from the host device via the transceiver. More specifically, the processor can convert the at least one test request into JTAG data for the JTAG test controller. Namely, the integrated circuit enables communications between the host device and the JTAG controller via a system bus without the need for a dedicated JTAG test access port (TAP) typically required for accessing the JTAG controller. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
