发明名称 Methods of forming an oxide layer in a transistor having a recessed gate
摘要 A method of forming an oxide layer on a semiconductor substrate includes thermally oxidizing a surface of the substrate to form an oxide layer on the substrate, and then exposing the oxide layer to an ambient including predominantly oxygen radicals to thereby thicken the oxide layer. Related methods of fabricating a recessed gate transistor are also discussed.
申请公布号 US2005003679(A1) 申请公布日期 2005.01.06
申请号 US20040850690 申请日期 2004.05.21
申请人 HYUN SANG-JIN;SHIN YU-GYUN;KOO BON-YOUNG;HONG SUG-HUN;JEON TAEK-SOO;RYU JEONG-DO 发明人 HYUN SANG-JIN;SHIN YU-GYUN;KOO BON-YOUNG;HONG SUG-HUN;JEON TAEK-SOO;RYU JEONG-DO
分类号 H01L21/336;H01L21/316;H01L21/762;(IPC1-7):H01L21/76;H01L21/31;H01L21/469 主分类号 H01L21/336
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