发明名称 Method and apparatus for checking the resistance of programmable elements
摘要 Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
申请公布号 US2005005208(A1) 申请公布日期 2005.01.06
申请号 US20010777036 申请日期 2001.02.05
申请人 CUTTER DOUGLAS J.;ONG ADRIAN E.;HO FAN;BEIGEL KURT D.;DEBENHAM BRETT M.;LUONG DIEN;PIERCE KIM;MULLARKEY PATRICK J. 发明人 CUTTER DOUGLAS J.;ONG ADRIAN E.;HO FAN;BEIGEL KURT D.;DEBENHAM BRETT M.;LUONG DIEN;PIERCE KIM;MULLARKEY PATRICK J.
分类号 G11C17/18;(IPC1-7):G01R31/28 主分类号 G11C17/18
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