发明名称 SYSTEM AND METHOD FOR CONTROLLING MEASURING UNIT OF SEMICONDUCTOR EQUIPMENT TO AVOID LOSS OF CONTROL NUMBER AND IMPROVE WORK EFFICIENCY
摘要 PURPOSE: A system for controlling a measuring unit of semiconductor equipment is provided to avoid a loss of a control number by attaching and recognizing a bar code, and to improve work efficiency by simultaneously monitoring the information of a plurality of measuring units. CONSTITUTION: A bar code recognizing part(110) recognizes the bar code attached to a measuring unit for measuring semiconductor equipment. Based upon the data detected by the bar code recognizing part, a control part(120) searches for the information of semiconductor equipment coinciding with the data. A display part(140) receives the information of the semiconductor equipment from the control part and displays the received information.
申请公布号 KR20050001296(A) 申请公布日期 2005.01.06
申请号 KR20030042900 申请日期 2003.06.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAN, SUN GIL;KIM, MIN;KIM, SUNG HAK
分类号 H01L21/66;(IPC1-7):H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址