发明名称 |
SYSTEM AND METHOD FOR CONTROLLING MEASURING UNIT OF SEMICONDUCTOR EQUIPMENT TO AVOID LOSS OF CONTROL NUMBER AND IMPROVE WORK EFFICIENCY |
摘要 |
PURPOSE: A system for controlling a measuring unit of semiconductor equipment is provided to avoid a loss of a control number by attaching and recognizing a bar code, and to improve work efficiency by simultaneously monitoring the information of a plurality of measuring units. CONSTITUTION: A bar code recognizing part(110) recognizes the bar code attached to a measuring unit for measuring semiconductor equipment. Based upon the data detected by the bar code recognizing part, a control part(120) searches for the information of semiconductor equipment coinciding with the data. A display part(140) receives the information of the semiconductor equipment from the control part and displays the received information.
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申请公布号 |
KR20050001296(A) |
申请公布日期 |
2005.01.06 |
申请号 |
KR20030042900 |
申请日期 |
2003.06.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HAN, SUN GIL;KIM, MIN;KIM, SUNG HAK |
分类号 |
H01L21/66;(IPC1-7):H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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