发明名称 Techniques for measurement of deformation of electronically scanned antenna array structures
摘要 Techniques for simultaneous measurement of multiple array elements of an array antenna. The array is illuminated with a coherent signal source, and each array element phase shifter is cycled through a range of phase shifter settings at a unique rate. The phase shifted signals from each array element are combined to provide a composite signal. The composite signal is processed to extract the phase of the coherent source signal as received at each element. The phase information is used to determine the location of the elements relative to each other.
申请公布号 US2005001760(A1) 申请公布日期 2005.01.06
申请号 US20030612693 申请日期 2003.07.02
申请人 MRSTIK A. VINCENT 发明人 MRSTIK A. VINCENT
分类号 G01S7/40;H01Q3/26;(IPC1-7):G01S7/40 主分类号 G01S7/40
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