发明名称 |
SELECTIVELY ALIGNING NANOMETER-SCALE COMPONENTS USING AC FIELDS |
摘要 |
An improved and novel method of selectively aligning and positioning nanometer-scale components using AC fields. The method provides for more precise manipulation of the nanometer-scale components in bridging test electrodes including the steps of: providing an alternating current (AC) field at a single electrode or between a plurality of electrodes to create an electric field in an environment containing nanometer-scale components. The electric field thereby providing for the aligning and positioning of the nanometer-scale components to the desired location. |
申请公布号 |
KR20040111513(A) |
申请公布日期 |
2004.12.31 |
申请号 |
KR20047016424 |
申请日期 |
2003.04.02 |
申请人 |
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发明人 |
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分类号 |
B82B3/00;C25D13/18;B03C5/02;C03B33/00;C30B33/00 |
主分类号 |
B82B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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