发明名称 GaN substrate and method of fabricating the same, nitride semiconductor device and method of fabricating the same
摘要 A GaN substrate comprises a GaN single crystal substrate, an AlxGa1-xN intermediate layer (0<x<=1) epitaxially grown on the substrate, and an GaN epitaxial layer grown on the intermediate layer. The intermediate layer is made of AlGaN and this AlGaN grows over the entire surface of the substrate with contaminants thereon and high dislocation regions therein. Thus, the intermediate layer is normally grown on the substrate, and a growth surface of the intermediate layer can be made flat. Since the growth surface is flat, a growth surface of the GaN epitaxial layer epitaxially grown on the intermediate layer is also flat.
申请公布号 US2004262624(A1) 申请公布日期 2004.12.30
申请号 US20040875512 申请日期 2004.06.25
申请人 AKITA KATSUSHI;TAKASUKA EIRYO;NAKAYAMA MASAHIRO;UENO MASAKI;MIURA KOUHEI;KYONO TAKASHI 发明人 AKITA KATSUSHI;TAKASUKA EIRYO;NAKAYAMA MASAHIRO;UENO MASAKI;MIURA KOUHEI;KYONO TAKASHI
分类号 H01L33/06;C30B25/02;C30B25/18;H01L21/20;H01L21/205;H01L29/20;H01L33/32;(IPC1-7):H01L33/00 主分类号 H01L33/06
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