发明名称 Functional testing of logic circuits that use high-speed links
摘要 A method is provided. The method comprises loading a memory within a link-based system with a functional test program, executing the functional test program in a processor core of the link-based system, and routing test signals generated during execution of the functional test program to a response agent embedded in the link-based system via an external path.
申请公布号 US2004267484(A1) 申请公布日期 2004.12.30
申请号 US20030603292 申请日期 2003.06.24
申请人 MAK TAK M.;LEE VICTOR W. 发明人 MAK TAK M.;LEE VICTOR W.
分类号 G01R31/317;G06F11/26;G06F19/00;(IPC1-7):G06F19/00 主分类号 G01R31/317
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