发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>Impurities are introduced into a gate electrode (103) formed on a semiconductor substrate (101) with a gate insulating film (102) interposed between them. A laser beam is applied to the gate electrode (103) to diffuse the introduced impurities to the interface between the gate electrode (103) and the gate insulating film (102). As a result depletion of the gate electrode (103) is suppressed.</p>
申请公布号 WO2004114413(A1) 申请公布日期 2004.12.29
申请号 WO2003JP07848 申请日期 2003.06.20
申请人 YAMAMOTO, TOMONARI;FUJITSU LIMITED;OKABE, KENICHI 发明人 YAMAMOTO, TOMONARI;OKABE, KENICHI
分类号 H01L21/28;H01L29/51;(IPC1-7):H01L29/78;H01L21/336 主分类号 H01L21/28
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