METHOD FOR FAULT LOCALIZATION IN CIRCUITS

摘要

Methods for using measured time resolved photon emission data and simulated time resolved photon emission data for fault localization are provided and described. In one embodiment, a method of localizing a fault in a circuit includes generating simulation photon emission data for the circuit. Moreover, measured photon emission data for the circuit is generated. The simulation photon emission data is compared with the measured photon emission data to generate a comparison result. Further, the comparison result is classified according to predetermined criteria. The classified comparison result is used in a fault localization technique to determine next action in localizing the fault.