发明名称 Methods of testing a digital frequency synthesizer in a programmable logic device using a reduced set of multiplier and divider values
摘要 Methods of testing a digital frequency synthesizer (DFS) having a programmable multiplier M and divider D. The full set of tests (wherein every value of M and D is tested) is reduced to a smaller set of tests in which each M/D ratio is tested to a specified resolution. A resolution and minimum and maximum values for M, D, and M/D are specified. An array is allocated, each M/D ratio having a corresponding location in the array, up to the specified resolution. For each MD pair meeting the specified criteria, an M/D ratio is calculated and idealized to the specified resolution, and the MD pair is stored in the corresponding array location. The result is an array of MD pairs that includes zero or one MD pair for each M/D ratio. Thus, by testing each MD pair within the array, all permissible permutations of the input clock frequency are tested.
申请公布号 US6836864(B1) 申请公布日期 2004.12.28
申请号 US20020092062 申请日期 2002.03.05
申请人 XILINX, INC. 发明人 WU YIDING
分类号 G01R31/28;G01R31/317;G01R31/3185;(IPC1-7):G01R31/28 主分类号 G01R31/28
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