发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE HAVING MOS TRANSISTOR WITH STRAINED CHANNEL USING HEAT TREATMENT
摘要 PURPOSE: A method of manufacturing a semiconductor device is provided to improve switching-speed of an MOS(Metal Oxide Semiconductor) transistor by obtaining a strained channel from an insulating layer with tensile stress using a heat treatment. CONSTITUTION: An MOS transistor is formed at a predetermined region of a semiconductor substrate. A stress layer is formed on the substrate including the MOS transistor(15). Physical stress of the stress layer is converted into tensile stress or the tensile stress of the stress layer is increased by using a heat treatment(21).
申请公布号 KR20040108141(A) 申请公布日期 2004.12.23
申请号 KR20030038889 申请日期 2003.06.16
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, SEOK U;KIM, MIN JU;KOO, JA HEUM;NOH, GWAN JONG;SUN, MIN CHEOL;YOON, SEON PIL
分类号 H01L21/335;H01L29/78;(IPC1-7):H01L21/335 主分类号 H01L21/335
代理机构 代理人
主权项
地址