发明名称 Method and circuit for detecting a fault of semiconductor circuit elements and use thereof in electronic regulators of braking force and of dynamics movement of vehicles
摘要 A circuit for detecting a defect of electronic components in an electronic control unit includes an output for driving a load (3). A redundant measurement of the current (IL) is executed at the contacts (G, S, D), in particular at the driven contacts (S, D), of one or more semiconductor circuit elements, and an error function of a semiconductor circuit element is detected when the comparison of two current values (IS, ISense1, ISense2) by way of the current flowing through a load (3, 3') indicates an unequal current distribution. This circuit is of use in electronic brake force or driving dynamics controllers for motor vehicles.
申请公布号 US2004260501(A1) 申请公布日期 2004.12.23
申请号 US20040494873 申请日期 2004.05.07
申请人 FEY WOLFGANG;ENGELMANN MARIO;OEHLER PETER 发明人 FEY WOLFGANG;ENGELMANN MARIO;OEHLER PETER
分类号 G01R31/00;B60L;B60T8/88;G01R19/00;G01R31/26;G01R31/316;G06F19/00;H03K17/082;(IPC1-7):G06F19/00 主分类号 G01R31/00
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