发明名称 Semiconductor memory device
摘要 There is an SRAM which can perform a high-speed read operation at a low power supply voltage and which can simplify a circuit configuration and manufacturing steps. When signals at levels "H" and "L" are output from a flip-flop to storage nodes, respectively, the threshold voltage of first and second N-channel MOS transistors having channel regions connected to the storage node decrease to improve the current drive capabilities of the transistors. The second N-channel MOS transistor is set in an ON state by the level of the storage node. In this case, when a word line goes to level "H", the first N-channel MOS transistor is turned on, and a bit line is drawn in a ground potential at a high speed.
申请公布号 US6834007(B2) 申请公布日期 2004.12.21
申请号 US20030681247 申请日期 2003.10.09
申请人 OKI ELECTRIC INDUSTRY CO., LTD. 发明人 TAKEMURA TAKASHI
分类号 G11C11/412;H01L21/8244;H01L27/11;(IPC1-7):G11C11/40 主分类号 G11C11/412
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