Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic insertion method of the same test facilitation circuit

摘要

This invention provides a semiconductor integrated circuit in which test facilitation technology (design for testability) of system on a chip (SOC) constructed of functional blocks or intellectual properties (IPs) is improved. This semiconductor integrated circuit takes out a test result of the functional block out of the SOC through a test result storage circuit which signature-compresses the test result.