发明名称 Image measuring method and image measuring device
摘要 An image measuring method according to the present invention comprises an illuminance computing step of computing illuminance of a workpiece (W) based on an indicated value set and inputted from the outside as well as on luminance of an illumination unit (20), and an exposure time computing step of computing an exposure time of an image pick-up unit (30). The illumination unit (20) and the image pick-up unit (30) are controlled according to the computed illuminance and exposure time to pick-up an image, so that an image satisfying both the illuminance of the workpiece (W) and an exposure time of the image pick-up unit (30) can be picked up. Therefore, even in a case in which a controllable range of luminance of the illumination device (20) is limited and the luminance can not be raised beyond the upper limit, an image having the brightness higher than the upper limit of luminance of the illumination unit (20) can be picked up by prolonging the exposure time of the image pick-up unit (30).
申请公布号 EP1486758(A2) 申请公布日期 2004.12.15
申请号 EP20040013672 申请日期 2004.06.09
申请人 MITUTOYO CORPORATION 发明人 YOSHIDA, HIROYUKI
分类号 G01B11/02;G01B11/24;G01J3/50;G01N21/01;G01N21/84;(IPC1-7):G01B11/24 主分类号 G01B11/02
代理机构 代理人
主权项
地址