SEMICONDUCTOR INTEGRATED CIRCUIT PROVIDED WITH STATIC MEMORY CELL SOFT DEFECT DETECTION UNIT AND METHOD FOR DETECTING SOFT DEFECT FOR THE SAME

摘要

PURPOSE: A semiconductor integrated circuit provided with a static memory cell soft defect detection unit and a method for detecting a soft defect for the same are provided to easily detect the soft defect by providing the circuit for detecting the soft defect. CONSTITUTION: A semiconductor integrated circuit provided with a static memory cell soft defect detection unit includes a plurality of static memory cells(M1-Mn), a bit line(BIT), a complementary bit line(BITB) and a current supplying circuit(35). The bit line is connected to the first nodes of the plurality of static memory cells and the complementary bit line is connected to the second node of the plurality of the static memory cells. And, the current supplying circuit is connected to the bit line and the complementary bit line so as to supply the current to the bit line and the complementary bit line in response to the test signal during the test mode.