发明名称 VISUAL INSPECTION METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a visual inspection method and device for eliminating the need of the exact positioning for a master pattern, for eliminating erroneous determination of determining a nondefective as a defective, and for restraining an increase of the kinds of reference pattern portions prepared as the master pattern. SOLUTION: In this method and device, appearances of inspection areas 16a-16i having repeated patterns are inspected based on comparison with the prescribed master pattern. The inspection areas 16a-16i are partitioned into a plurality of vertical and lateral visual field areas, and reference pattern portions 17a-17i different each other including respective edge shapes a difference by a difference of the edge shapes of the inspection areas 16a-16i included in the respective partitioned visual field areas are used as the master pattern 17. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004347323(A) 申请公布日期 2004.12.09
申请号 JP20030139344 申请日期 2003.05.16
申请人 TOPCON CORP 发明人 AKIMOTO SHIGEYUKI;ITO TAKASHI
分类号 G01N21/94;G01N21/95;G01N21/956;H01L21/66;(IPC1-7):G01N21/956 主分类号 G01N21/94
代理机构 代理人
主权项
地址