发明名称 TEST DEVICE FOR SEMICONDUCTOR MEMORY
摘要 PURPOSE: To efficiently perform writing data to an IC memory to which an address X and an address Y are inputted in series. CONSTITUTION: An X address and a Y address from a pattern generator 11 are supplied to selectors 15, 19 and 16, 21, two pieces of data DA and DB are supplied to selectors 15, 19 and 16, 21 in the same way. Also, a first and a second selection signals SE1, SE2 from the pattern generator are supplied to selectors 31, 32, outputs of the selectors 31, 32 are supplied to multiplexers 17, 22 as a control signal respectively through gates 18, 23. For example, X and Y addresses, are selected in the selector 15, 16n respectively, two pieces of data DA, DB are selected in the selector 19, 21, addresses, data from the multiplexer 17, 22 are subjected to wave-shaping by waveform shaping circuits 25, 26, and supplied to a memory 27 to be tested.
申请公布号 JPH08329699(A) 申请公布日期 1996.12.13
申请号 JP19950130229 申请日期 1995.05.29
申请人 ADVANTEST CORP 发明人 TAMAGAWA TOMOHISA;HASHIMOTO JUN
分类号 G01R31/28;G06F11/22;G11C29/00;G11C29/10 主分类号 G01R31/28
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