发明名称 |
CONDITIONER ASSEMBLY OF CMP APPARATUS FOR SEMICONDUCTOR WAFER FOR IMPROVING PROFILE OF SURFACE OF POLISHING PAD |
摘要 |
PURPOSE: A conditioner assembly of a CMP apparatus for semiconductor wafer for improving a profile of a surface of a polishing pad is provided to prevent damage and deformation due to physical force applied from the polishing pad by using the first gimbal and the second gimbal. CONSTITUTION: A rotary shaft is rotatably supported by a conditioner head. The first gimbal(30a) having a shape of plate is fixed to an end part of the rotary shaft. The first gimbal is opposite horizontally to the polishing pad. The second gimbal is opposite to a bottom face of the first gimbal. A diamond disk is installed on a lower part of the second gimbal. A guide part is used for transmitting rotatory power to the second gimbal on the basis of the first gimbal and guiding the top/down sliding movement. An elastic bodies(36a,36b) are supported from the bottom face of the first gimbal and provides elastic force to a lower direction of the second gimbal. A clamp is supported by the first gimbal and is used for limiting the sliding distance to the lower direction of the second gimbal.
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申请公布号 |
KR20040103634(A) |
申请公布日期 |
2004.12.09 |
申请号 |
KR20030034682 |
申请日期 |
2003.05.30 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, SEUNG JIP |
分类号 |
H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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