发明名称 MULTIPLE CONNECTION DEVICE FOR ELECTRONIC MICRO-CIRCUIT TEST SYSTEMS
摘要 The invention relates to multiple connection devices for electronic micro-circuit test systems, characterised in comprising: a pin connector (1), having a chip (2) made from a first electrically-insulating material and a number of pins (3), an electrical distribution connector (20), with a plate (21) made from a second electrically-insulating material with a thermal expansion coefficient essentially the same as that of the first material, a printed circuit board (30) and flexible electrical connection means (40) to connect the first connection pins (24) to the second connection pins (32). The above finds application particularly in testing electronic microcircuits such as microcomputer electronic chips and miniature photosensitive cells.
申请公布号 WO2004106948(A1) 申请公布日期 2004.12.09
申请号 WO2003FR01560 申请日期 2003.05.23
申请人 PROBEST;SABATIER, ANDRE;CHASSERIEAU, CLAUDE;CHASSERIEAU, VINCENT 发明人 SABATIER, ANDRE;CHASSERIEAU, CLAUDE;CHASSERIEAU, VINCENT
分类号 G01R1/073 主分类号 G01R1/073
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