发明名称 SEMICONDUCTOR DEVICE WITH IMPROVED CONNECTION-STRUCTURE BETWEEN PAD ELECTRODE AND CONDUCTIVE TERMINAL AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to prevent the short and the degradation of step coverage in a metal line by forming the metal line through a via hole of a semiconductor chip and to minimize the damage of a conductive terminal due to mounting-stress by forming the conductive terminal on a convex portion of the chip. CONSTITUTION: A pad electrode(53) is formed on a first main surface of a semiconductor chip(51A). A convex portion(58) is formed on a second main surface of the chip. A support substrate(56) is attached to the first main surface of the chip. A metal line layer(64) is formed from the second main surface of the chip through a via hole(VH) to the pad electrode. At this time, the convex portion of the chip is coated with the metal line layer. A conductive terminal(66) is formed on the convex portion.
申请公布号 KR20040101924(A) 申请公布日期 2004.12.03
申请号 KR20040037141 申请日期 2004.05.25
申请人 SANYO ELECTRIC CO., LTD. 发明人 TAKAO, YUKIHIRO
分类号 H01L23/52;H01L21/3205;H01L23/12;H01L23/31;H01L23/48;H01L23/485 主分类号 H01L23/52
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