发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGE USING IMPROVED SOLDER RESIST PATTERN AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method of manufacturing a semiconductor package and a method of manufacturing a semiconductor device are provided to prevent melted solder bump from penetrating into an interface between a first pad and a solder resist pattern and to restrain electrical short between solder bumps by exposing all the sides of the first pad through the solder resist pattern. CONSTITUTION: A first conductive pattern with a first pad(7a) is formed on one surface of an insulating substrate. A second conductive pattern with a second pad is formed on the other surface of the insulating substrate. A solder resist pattern(9) with an opening capable of exposing all the sides of the first pad is formed on one surface of the insulating layer. A semiconductor device is electrically connected with the first pad via a first solder bump(12). An insulating adhesive(13) is interposed between the semiconductor device and the substrate.
申请公布号 KR20040100949(A) 申请公布日期 2004.12.02
申请号 KR20040035085 申请日期 2004.05.18
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 INOUE, AKINOBU;KAJIKI, ATSUNORI;TAKATSU, HIROYUKI;TSUBOTA, TAKASHI;YAMANISHI, NORIO
分类号 H01L23/12;H01L21/48;H01L21/56;H01L21/60;H01L23/498;H05K3/34;H05K3/46 主分类号 H01L23/12
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